Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

Masahiro Yoshita,Toshimitsu Mochizuki,Lin Zhu Lin Zhu,Tetsuya Nakamura,Hidehiro Kubota,Yoshihiko Kanemitsu,Changsu Kim Changsu Kim,Mitsuru Imaizumi,Hidefumi Akiyama,Shaoqiang Chen Shaoqiang Chen

doi:10.1109/pvsc.2015.7356199

Absolute electroluminescence imaging of multi-junction solar cells and calibration standards

Masahiro Yoshita, Toshimitsu Mochizuki + Show 8 more

https://doi.org/10.1109/pvsc.2015.7356199

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Publication Date: Jun 1, 2015

Citations: 13

Affiliation: Kavli Institute for the Physics and Mathematics of the Universe, Japan Aerospace Exploration Agency, Kyoto University, East China Normal University

#Planar Light-emitting Diode #Absolute Electroluminescence + Show 8 more

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Abstract

We developed absolute electroluminescence (EL) calibration standards to evaluate absolute radiative-emission rates from subcells in multi-junction (MJ) solar cells. The absolute-EL-measurement system consists of an EL imaging setup and an emission-intensity-calibrated planar light-emitting diode with a circular open aperture as an emission-intensity standard. We applied this system to the measurements of the absolute EL imaging of a monolithic satellite-use InGaP/GaAs/Ge MJ solar cell. From the observed absolute EL images, we characterized external EL quantum efficiencies and internal open-circuit voltages of InGaP and GaAs subcells.

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