Abstract
A two-beam nonlinear interferometric technique is described whereby the amplitude and sign of both the real and imaginary parts of the nonlinear susceptibility χ 3 may be determined. Moreover, this technique permits an extremely precise determination of the electronic and molecular contributions to χ 3 . Hence, we ascertain the electronic fraction of the Kerr constants of CS 2 and C 6H 6 to be 12.7 ± 1.1% and 19.8 ± 0.8%, respectively. These results provide a basis for the comparison of nonlinear refractivity and frequency-mixing measurements in these materials and an accurate means for the absolute calibration of a variety of measurements of χ 3 .
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