Absolute determination of inelastic mean-free paths and surface excitation parameters by absolute reflection electron energy loss spectrum analysis

Abstract

An analytical approach was proposed for simultaneously determining an inelastic mean-free path (IMFP) and a surface excitation parameter (SEP) with absolute units by the analysis of an absolute experimental reflection electron energy loss spectrum. The IMFPs and SEPs in Ni were deduced for electrons of 300 to 3000 eV. The obtained IMFPs were in good agreement with those calculated using the TPP-2M equation. The Chen-type empirical formula was proposed for determining the SEP. The results confirmed the applicability of the present approach for determining the IMFP and SEP for medium-energy electrons.