Absolute calibration of X-ray semiconductor detectors in the 0.3−1.5 keV photon energy range on synchrotron radiation from VEPP-2M storage ring

Abstract

The paper presents the results of absolute spectral responsivity measurements for SPPD11 and SPPD11-04 pulse-type silicon detectors, carried out in the X-ray energy range from 0.3 to 1.5 keV with a relative uncertainty of about 8% (1 σ). The measurements were performed using the detector exposure to a well-calculable synchrotron radiation through the selective filters with well-known transmittance. Synchrotron radiation from the VEPP-2M storage ring was utilized for these measurements. The spectral responsivity of the detectors was restored by solving the proper system of integral equations on the base of measurement data. For increasing the calibration accuracy, the X-ray transmittance near the L-absorption edges of the filters used and the angular spread in the positron beam of the storage ring were experimentally determined.