Absolute beam emittance measurements at RHIC using ionization profile monitors

Abstract

In the past, comparisons between emittance measurements obtained using ionization profile monitors, Vernier scans (using as input the measured rates from the zero degree counters, or ZDCs), the polarimeters and the Schottky detectors evidenced significant variations of up to 100%. In this report we present studies of the RHIC ionization profile monitors (IPMs). After identifying and correcting for two systematic instrumental errors in the beam size measurements, we present experimental results showing that the remaining dominant error in beam emittance measurements at RHIC using the IPMs was imprecise knowledge of the local beta functions. After removal of the systematic errors and implementation of measured beta functions, precise emittance measurements result. Also, consistency between the emittances measured by the IPMs and those derived from the ZDCs was demonstrated.