Abstract
Absence of nonradiative recombination (NRR) centers inside GaAs wells and at GaAs/Al0.2Ga0.8As hetero-interfaces in a Si modulation-doped GaAs/Al0.2Ga0.8As multiple quantum well (MQW) structure became clear for the first time by an improved two-wavelength excited photoluminescence (PL). The NRR parameters of modulation and uniform-doped MQWs were determined self-consistently by combining the analysis of the PL intensity change due to the below-gap excitation with the internal quantum efficiency and the recombination lifetime. These results showed the superiority of modulation-doping scheme over that of uniform-doping for light emitting devices.
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