Abstract
This paper explains the principles of the theory of aberrations of the dispersive systems of raster spectrometers. Formulas are given for calculating the aberration components for apparatus with single and double diffraction of the beams at a flat reflective diffraction grating. Quantitative relationships are given that determine the character and degree of the distortions of the spread function of the device under the influence of the aberrations of the dispersive system; numerical allowances are established on the aberrational components in various system configurations. Ways of scanning the spectrum and their applicability for raster spectrometers are considered. © 2004 Optical Society of America
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