Abstract
This study developed a high-precision sample goniometer that can be driven over a wide range of angles to examine the detailed and comprehensive electronic structure of materials via angle-resolved photoemission spectroscopy (ARPES). The sample goniometer can tilt the sample in the range of ±90° from the normal direction of the sample. Combined with a rotary feedthrough that controls the polar angle, all the photoelectrons emitted from the sample surface can be detected. The sample goniometer can rotate the azimuth angle of the sample in the range of ±180°, facilitating the investigation of the symmetry of the electronic structure via polarization of the incident light. The tilt rotation and the azimuth rotation could be controlled with repeatability of ±0.007° and ±0.016°, respectively, by correcting gear transmission errors. The ARPES measurements of Au(111), a SnO(001) film, and a SnO film after exposing to the atmosphere demonstrated the effectiveness of the developed sample goniometer.
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