Abstract
A wavelength dispersive X–ray spectrometer is designed and developed for X–ray fluorescence analysis and spectroscopy using an X–ray microprobe at SPring–8 BL39XU. The spectrometer uses a flat analyzer crystal, and X–rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit–scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X–ray source, and preliminary experimental results of the X–ray microprobe by using brilliant hard X–rays from an X–ray undulator are reported.
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