Abstract
The wavelength calibration is a key step for a variable-included-angle plane grating monochromator (VIA-PGM). At present, the wavelength calibration of the VIA-PGM is done separately for sine drives of the optical components. But the positions of the sine drives are linked by the grating equation and the focusing condition. A new wavelength calibration method for VIA-PGM is presented in which the relationship between the wavelength and both sine drive positions are included in a mathematical model. By this method the structural parameters for both sine drives are calibrated at the same time. It has been successfully applied to the wavelength calibration of a VIA-PGM in the Hefei Light Source, China. The results show that this method is effective and can perform accurate wavelength calibration.
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