A versatile biaxial stretching device for in situ synchrotron radiation small- and wide-angle x-ray scattering measurements of polymer films.

Abstract

A biaxial stretching device is designed and developed for the real-time structural measurements of polymer films. This device adopts a vertical layout to perform real-time x-ray scattering measurements. It has a maximum stretching ratio of 8 × 8 in two perpendicular directions. Its maximum experimental temperature and stretching rate are 250 °C and 100 mm/s, respectively. The control accuracies of the experimental temperature and stretching rate are ±1 °C and 0.01mm, respectively. All the parameters related to film biaxial processing, such as stretching speed, stretching ratio, and temperature, can be independently set. The device feasibility is demonstrated via a real-time experiment in a synchrotron radiation beamline. Wide-angle x-ray diffraction, small-angle x-ray scattering, and stress-strain data can be simultaneously obtained during various stretching modes. The proposed device fills the gap between the synchrotron radiation x-ray scattering technique and the biaxial stretching processing of polymer films. This device will play an important role in improving the understanding of the physics behind biaxial polymer processing.