Abstract
A universal calibration method for eliminating topography-dependent current in conductive AFM and its application in nanoscale imaging
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https://doi.org/10.1007/s12274-024-6651-0
Copy DOIJournal: Nano Research | Publication Date: Apr 22, 2024 |
A universal calibration method for eliminating topography-dependent current in conductive AFM and its application in nanoscale imaging
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