A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface

Abstract

The availability of faster electronic components allows the design of more effective and efficient test equipments. However in high-speed applications, the effect of interconnects between the tester and the device under test “DUT” introduces ringing, overshoot and timing delay problems. In this paper we present an output high speed buffer which helps to cancel the overshoot, undershoot, and ringing. The buffer which has a unity gain, presents a high output current and introduces small delay. It is able to drive the comparator of the tester through the transmission line with minimum distortion of the signal. Compared with other approaches, the use of this output buffer provides good improvement of the signal. This output buffer which is designed for the interface between tester and DUT can be considered for communication between high speed devices in printed circuits boards. The calibration procedure is explained in order to determine the delay introduced by the buffer and to measure low and high voltage levels of the digital output signal of the buffer.