Abstract
A novel built-in self-test (BIST) scheme is proposed for read-only memories (ROMs). This scheme, based on memory partitioning and signature analysis, supports both on-line and off-line testability. With a hardware cost comparable to parity checking, the on-line testing scheme provides much better error detection capability than conventional strategies. The off-line test retains a high error coverage of at least 99.9985%. In addition, the hardware resources are unified; thus, the total hardware cost is greatly reduced in comparison to incorporating the two test strategies separately.
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