A two-unit parallel redundant system with bivariate exponential lifetimes: Shunji Osaki. Microelectron. Reliab.30, 521 (1980)

Abstract

Data from MIL-HDBK-217B is used to examine the temperature dependence of failure rate of electronic components in actual usage. The dependence is much smaller than expected from the published values of activation energy of component failure mechanisms, or assumed in some commonly used rules-of-thumb.