A Two-Step Procedure for Characterizing Obstacles Under a Rough Surface From Bistatic Measurements

Abstract

A two-step electromagnetic detection procedure is proposed to characterize a dielectric obstacle buried at low depth under a rough surface from single-frequency and multistatic data. First, we have developed, in the framework of the small perturbation theory, a correlation procedure of the scattered field, which enables us to recover an estimation of the roughness profile. This method is tested for various cases with synthetic data provided by a rigorous boundary integral solver. Second, the obtained surface profile is introduced into the numerical simulation due to a finite-element code. An iterative process is then used, based on a level-set formulation, to obtain the shape of the buried target. The influence of the prior step on the accuracy of the reconstruction of the target is studied via various criteria and for different configurations.