Abstract
We present preliminary results on the analysis and application of an optical detector for imaging light contours. The sensor has a two-dimensional structure and uses a TCO/ μc–p–i–n Si:H configuration as the active device and two lateral ohmic contacts to convert the projected light image into a lateral output photovoltage. A steady-state light pattern was used to simulate the image, in addition to a smallest intensity scanner beam which moved across the device creating an ac output signal. This signal depends on the position, intensity and homogeneity of the light pattern. A bidimensional model to explain the sensor performance is presented based on a small-signal ac circuit analysis.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
