Abstract
Starting from the well-known idea of atomic shadowing during thin film growth ( i.e. ballistic aggregation) a two-dimensional computer model is developed which includes surface relaxation by thermally induced surface diffusion and atomic attraction for a two-component system. An attempt was made to link the model interaction energies to real bonding energies in CoCr thin films. The model was applied to investigate structural as well as local configuration changes in the aggregates during systematic parameter variations.
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