Abstract
Here, we apply 20 MeV particle-induced X-ray emission (PIXE) to elemental analysis of microplastic samples with a diameter of approximately 2 mm, collected from the seashores of the northeastern area of Honshu in Japan. The samples were in a grain form with unwanted elements adhering to their surfaces. The PIXE measurements were conducted in a helium atmosphere. For normalization, the number of K X-rays of the residual gas argon was used instead of the directly measured beam irradiation, and the number of continuous X-rays in the PIXE spectrum was used instead of the mass of each sample. Thirteen elements were identified on the microplastics, among which were toxic chromium and lead. Thus, PIXE analysis is useful for analyzing microplastic samples.
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