Abstract
To bridge the gap between lab-based high-resolution X-ray tomography (micro-CT) and synchrotron-based micro-CT, lab-scale accelerator-based or Inverse Compton Scattering (ICS) X-ray sources are a promising technology. In the scope of a large-scale project funded by the European Regional Development Fund (Interreg Grensregio), a new ICS source dubbed Smart*Light is being developed at TU Eindhoven. In this work, we present the advantages of this source compared to existing systems and its potential in industrial X-ray CT.
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