Abstract
This paper presents an interactive MS-Windows(R)-based framework for high-level specification and analysis of tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. As novel contributions we provide an object-oriented tool for Boundary Scan and LSSD test automation with support for remote tests, including interfaces to circuit description, chip interconnection, test vector analysis and test vector generation. The system includes features like remote testing (using client-server technology), project management, menu-based command entry, user-defined configuration and a comprehensive set of commands.
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