Abstract

In this paper, a back-illuminated (BSI) time-of-flight (TOF) sensor using 0.2 µm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) technology is developed for long-range laser imaging detection and ranging (LiDAR) application. A 200 µm-thick bulk silicon in the SOI substrate is fully depleted by applying high negative voltage at the backside for higher quantum efficiency (QE) in a near-infrared (NIR) region. The proposed SOI-based four-tap charge modulator achieves a high-speed charge modulation and high modulation contrast of 71% in a NIR region. In addition, in-pixel drain function is used for short-pulse TOF measurements. A distance measurement up to 27 m is carried out with +1.8~−3.0% linearity error and range resolution of 4.5 cm in outdoor conditions. The measured QE of 55% is attained at 940 nm which is suitable for outdoor use due to the reduced spectral components of solar radiation.

Highlights

  • Much attentions have been paid to complementary metal oxide semiconductor (CMOS)-based time-of-flight (TOF) range image sensors to be used for a variety of applications such as AR/VR/MR, security systems, drones, robots and autonomous vehicles [1,2,3,4]

  • single photon avalanche diode (SPAD)-based direct TOF sensors need relatively complicated circuits with high-speed clocking for time-stamp measurements of photons and statistical processing for removing the influence of ambient light and wide dynamic range, and, as a result, SPAD-based direct TOF sensors have a difficulty of having high spatial resolution, or large pixel number

  • To address the issues for next-generation applications of TOF imagers, this paper proposes a backside illuminated (BSI) silicon-on-insulator (SOI) based four-tap lock-in pixel indirect TOF imager using short-pulse modulation [17]

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Summary

Introduction

Much attentions have been paid to complementary metal oxide semiconductor (CMOS)-based time-of-flight (TOF) range image sensors to be used for a variety of applications such as AR/VR/MR, security systems, drones, robots and autonomous vehicles [1,2,3,4] These near-future applications require more distance in its measurement range and higher tolerance and resolution under high ambient light operation for outdoor use. SPAD-based direct TOF sensors need relatively complicated circuits with high-speed clocking for time-stamp measurements of photons and statistical processing for removing the influence of ambient light and wide dynamic range, and, as a result, SPAD-based direct TOF sensors have a difficulty of having high spatial resolution, or large pixel number Another issue of current SPAD-based imagers is low photon detection efficiency (PDE) at near-infrared (NIR).

Lock-In Pixel Structure and Operation
SOI-Based Four-Tap Lock-In Pixel for TOF Sensors
Developed
TOF Range Calculation and Resolution with Four-Tap Lock-On-Pixel and Short
Implemented TOF Sensor Chip
Measurement Results
10. Modulation
Distance Measurement
Conclusions
Full Text
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