Abstract
AbstractDespite the topographic appearance of the image derived from the scanning electron microscope operated in the secondary electron emission mode it is impossible to make linear measurements from single two dimensional micrographs and relate these accurately to distances in the third dimension.This paper describes a stereometer specifically designed for the examination and measurement of stereopair scanning electron micrographs. The new instrument uses rotary encoders attached to the movement of the photo‐carriage to register the coordinates of image features in both members of a stereoscopic. These raw data are passed to a microcomputer programmed for the reduction and conversion to real three dimensional values according to the geometry of the projection in scanning electron microscope image. This allows large quantities of data to be collated without the errors and tedium involved in manual collection.The need for rapid data acquisition arose during a study on characterisation of resorption of bone by osteoclasts, where the collection and correlation of large quantities of data were required to permit a statistical interpretation to be made.
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