Abstract

The effect of the deposition of an overlayer on low-energy-electron- diffraction patterns is described by a Green's-function method which calculates the Green's function associated with the surface before the deposition of an overlayer. The theory treats the clean-surface reflection coefficients as input information. A muffin-tin-potential model is assumed for the two-dimensionally periodic overlayer. The exact reflection coefficient of an elastically scattered beam from the overlayer-substrate system is expressed in terms of structure constants and phase shifts of the adsorbate, as well as the reflection coefficients of diffracted beams from the clean substrate. With known clean- surface reflection coefficients, the overlayer problem is similar to that of a monolayer crystal, the structure constants and the phase shifts of the adsorbate only are necessary to be calculated. Thus this theory offers a simpler way in dealing with complicated overlayer low-energy-electron-diffraction problems. (AIP)

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.