A theory of cyclotron resonance line widths based on continued fraction representation

Abstract

Using Mori's projection technique, we derive a cyclotron resonance power absorption formula in a continued fraction form, which can be changed into a power series form in the lowest order approximation. It is shown that the expansion coefficient ε plays the role of an additional fitting parameter. With appropriate values of ε and the deformation potential constant for Ge and Si, the temperature dependence of the width agrees quite well with the existing experimental data.