Abstract

We report a new method for the simultaneous determination of the minority carrier lifetime, diffusion length and diffusion constant in a semiconducting medium. The method consists of a space-dependent study of the amplitude and phase of the minority carrier density (or current) induced by a sinusoidally modulated photon beam. To illustrate our method, we have solved a one-dimensional time-dependent diffusion equation using a finite Fourier transformation. The procedure is exact and can readily be extended to multidimensional systems.

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