Abstract
The calculated intensities of the X-ray beam behind the exit surface of the Ge [440, {\bar 2}20] dispersive monolithic monochromator for Co Kα1 radiation are presented. The reflections 440 and {\bar 2}20 resulting from Ge {000, 440, 260, {\bar 2}20} coplanar four-beam diffraction were taken into account and the influence of the π/2 reflection 260 is discussed. The four-surface arrangement of Ge [440, {\bar 2}20] providing the resultant beam parallel to the incident beam is considered. For comparison Ge [440, {\bar 2}20] in the two-beam approximation is solved. The obtained results demonstrate that the four-beam basis of diffraction affects the resultant beam. The quality of the X-ray beam evaluated behind the examined monochromators also provided the conditions for the use of such monochromators as wavelength standards.
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