Abstract
A practical method to correct X-ray powder diffraction patterns for the effects of preferred orientation in the case of monoclinic crystals is presented. The method is based on the use of symmetrized harmonics to describe the preferred orientation. To obtain a texture-free result the diffraction pattern must be measured both in symmetrical transmission and in symmetrical reflection modes using a spinning sample. The method is tested by measuring pole figures for a cellulose powder sample. The analysis of the results shows that by averaging the measured intensities properly the effect of texture can be diminished by one order of magnitude. This accuracy is sufficient for applying the method, for example, in quantitative determination of crystallinity of cellulose.
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