A testing scheme for mixed-control based reversible circuits

Abstract

In recent years, the design and synthesis of the reversible quantum circuits have received immense importance in computing world. As the advancement is going on, simultaneously newer challenges are evolving like fault detection and testing in the reversible circuits. To address these issues, proper testing techniques will have to be developed for efficient detection of the faults. In this work, we propose a fault detection scheme for efficient detection of the faults in any type of reversible circuits which may consist of completely positive or completely negative or mixed controlled Toffoli gates. This is suitable for very large circuits with minimum number test vectors. We have tested our scheme on several reversible benchmark circuits. This scheme detects fault as well as localizes the faulty zone. Experimental results are presented and a comparative analysis with recent works has been made.