Abstract
We report calibration and performance tests of a terahertz fast-sweep optoelectronic frequency-domain spectrometer designed for industrial applications, aimed at quantifying its performance specifications and demonstrating its suitability for envisaged usage. The frequency scale is calibrated using atmospheric water vapour lines and a silicon wafer etalon; the amplitude linearity is verified using a set of silicon plates. Instrument performance is tested by measuring transmission properties of a variety of representative samples and comparing with a time-domain spectrometer and a frequency-domain spectrometer.
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