A Temperature Drift Compensation Method for Pulsed Eddy Current Technology.

Biting Lei,Pengxing Yi,Jiayun Xiang,Yahui Li

doi:10.3390/s18061952

Biting Lei, Pengxing Yi + Show 2 more

Open Access

https://doi.org/10.3390/s18061952

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Abstract

Pulsed eddy current (PEC) technology is another important non-contact nondestructive testing technology for defect detection. However, the temperature drift of the exciting coil has a considerable influence on the precision of PEC testing. The objective of this study is to investigate the temperature drift effect and reduce its impact. The temperature drift effect is analyzed theoretically and experimentally. The temperature drift effect on the peak-to-peak values of the output signal is investigated, and a temperature compensation method is proposed to reduce the effect of temperature variation. The results show that temperature drift has a negative impact on PEC testing and the temperature compensation method can effectively reduce the effect of temperature drift.

Highlights

Pulsed eddy current (PEC) technology is another important and effective electromagnetic nondestructive testing technology which possesses many advantages including more extended detection depth, richer information, higher sensitivity and robustness [1]
The effect of temperature drift is ignored by various scholars
Factors that affect the accuracy and sensitivity of PEC testing have attracted the attention of numerous scholars

Summary

Introduction

Pulsed eddy current (PEC) technology is another important and effective electromagnetic nondestructive testing technology which possesses many advantages including more extended detection depth, richer information, higher sensitivity and robustness [1]. Accuracy and sensitivity are essential for PEC testing. Many factors are likely to affect the accuracy and sensitivity of PEC testing, such as lift-off noise, tilt effects, geometric size of PEC probe, noise, temperature drift effect, etc. The effect of temperature drift is ignored by various scholars. Factors that affect the accuracy and sensitivity of PEC testing have attracted the attention of numerous scholars. This study found that the slope of the linear curve of the peak value of the difference signal and the lift-off is tied to the depth and width of the defect. Tian and Sophian [10]

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Conclusion