Abstract
A method of obtaining approximate ionization and appearance potentials using a Bendix time-of-flight mass spectrometer was developed. Using this method, which is called the energy compensation technique, ionization and appearance potentials may be obtained usually in less than one minute. The method, being instrumental in character, eliminates the necessity of obtaining the usual ionization efficiency curve. Finally, some results of ionization potentials determined for various compounds using the linear extrapolation method, logarithmic plot method, extrapolated voltages difference method, and the energy compensation method are tabulated.
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