Abstract
A novel technique is described for producing specimens for electron microscopy with thin regions adjacent to the original specimen surface. The technique involves the electropolishing of a disc specimen, one surface of which is masked with a heavy organic liquid. When the specimen is perforated the masking liquid also serves to isolate the thin areas from further electrochemical or chemical attack. The technique has been applied to studies of helium bubbles in niobium and Nb-1 %Zr.
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