Abstract
AbstractA method is presented for performing angle‐resolved electron energy loss spectroscopy (ARELS) using a doublepass cylindrical mirror analyzer (CMA) which contains an angle‐resolving movable aperture. Both the electron gun contained in the CMA and an off‐axis electron gun are used in these studies. The technique is illustrated by ARELS spectra taken from a cleaned polycrystalline tin surface because observing the behavior of the surface and bulk plasmon features provides a direct and simple way of assessing surface sensitivity. The spectra demonstrate that the incidence angle of the primary beam, the collection angle with respect to the sample normal and the primary beam energy all have a very large effect on surface senstivity.
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