A tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation.

Abstract

We present a newly constructed spectrometer for negative-ion/positive-ion coincidence spectroscopy of gaseous samples. The instrument consists of two time-of-flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument can measure double and triple coincidences between mass-resolved negative and positive ions with high detection efficiency. First results include identification of several negative-ion/positive-ion coincidence channels following inner-shell photoexcitation of sulfur hexafluoride (SF6).