Abstract

Abstract In this work, the growth of molybdenum disulfide (MoS2) was systematically investigated. Firstly, the stepwise investigation of dual source precursor approach was determined by energy dispersive X-ray, non-resonant Raman spectroscopy and Fourier transform Infrared. The spin-coated MoS-based films were transformed into MoS2 thin films via thermal vapour sulfurization with carbon disulfide as the sulfurizing source. The extension of sulfurization duration provides the better homogeneity and compactness of MoS2 thin films. However, the deformation of MoS2 nanostructure was observed beyond 40 min of sulfurization duration. X-ray photoelectron spectroscopy detects the present of Mo4+ 3d and S2− 2p chemical states, which proves the highly formation of 2H-MoS2. Next, absorption features of MoS2 were discovered at ∼668 nm, ∼617 nm, and ∼447 nm. Resonant Raman (RR) spectroscopy shows multilayers of MoS2 are grown. However, multilayers wall of MoS2 nanoparticles was observed by the high-resolution transmission electron spectroscopy (HRTEM). The deviation of these observations (RR and HRTEM) is due to the rotational stacking fault of MoS2 layers.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call