Abstract

Context. Double eclipsing binaries are gravitationally bound quadruple systems in a ‘2+2’ configuration where both of the binaries are eclipsing. These systems are interesting objects to better understand stellar formation, to investigate the dynamical interaction between the two binary systems, or to study certain stages of stellar evolution, such as common-envelope events or Type Ia Supernovae. Aims. With this work, we aim to determine if double eclipsing binaries can be found using ZTF data and what the difficulties are in doing so. Secondly, we aim to significantly increase the number of known double eclipsing systems and determine how this sample differs from samples of double eclipsing binaries found with other telescopes. Methods. We developed a new method to systematically search for double eclipsing binaries in sparsely sampled light curves. For this we used box-least-squares (BLS) to search for the period of the first binary in the system. We then removed that signal from the light curves, and searched the residual light curve again with BLS to find the second period. We applied this method to ZTF light curves of 575 526 eclipsing binaries known in the Gaia eclipsing binary catalogue. Results. We report the discovery of 198 new double eclipsing binary systems. The shortest and longest orbital periods of the newly detected systems are 0.11 days to 323 days respectively. Conclusions. We successfully implemented a method that systematically searches for double eclipsing binary systems in sparsely sampled data. In total 198 new double eclipsing binary systems have been found in 575 5 26 light curves (≈0.034%). The ZTF sample typically contains more short period binaries compared to the TESS sample, but is also able to find systems with longer periods than what is currently known. We expect that at least three to four times more quadruples can be found by applying this method to all ZTF stellar light curves, by increasing the number of data points as a result of longer observations, and by implementing an automatic detection mechanism that replaces visual inspection.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call