Abstract
An in situ technique for studying the effect of a pulsed electromagnetic field on dendrite fragmentation behavior based on synchrotron X-ray imaging has been developed, involving the passage of an oscillating current through a foil specimen placed in a static magnetic field. In all cases, the application of a pulsed electromagnetic field to an array of Al–15wt.%Cu dendrites led to an increase in dendrite fragmentation rate. The induced movement of inter-dendritic liquid between the primary and secondary dendrite arms even at high solid fraction led to instabilities in the local temperature–concentration–curvature equilibrium and the rapid remelting of the most vulnerable microregions. The new in situ methodology provides a basis for the optimization of pulsed electromagnetic field parameters to enhance grain refining performance for specific alloys and casting conditions.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
