A SVD-based approach for estimating the data external to the measurement region in the planar wide-mesh scanning

Abstract

This work deals with an effective technique for estimating a proper number of voltage data external to the near-field measurement region in the recently developed planar wide-mesh scanning. It relies on the nonredundant sampling representations of the electromagnetic field and uses the singular value decomposition method to extrapolate the outside samples. This allows one to reduce in a significant way the unavoidable truncation error occurring in the near-field – far-field transformation with planar wide-mesh scanning. Some numerical tests, assessing the accuracy of the technique and its stability with respect to random errors affecting the data, are reported.