Abstract
Piezoelectric materials perform mechanical-to-electrical energy conversion and have unique and enhanced properties, particularly in the thin film form. In this work, the chemical potential of free surface for piezoelectric solids is defined and the mechanical field, electric field, and stability of a piezoelectric ceramic thin film are linearly analyzed. Expressions of the perturbed stress and electric field intensities, to first order approximation in perturbed amplitude to wavelength ratio, are derived, which show that the stresses and electric field intensities are directly proportional to the lattice mismatch and the perturbed amplitude, and decrease with increasing perturbed wavelength. The critically perturbed wavelength, which the flat film for the perturbation is stable, is obtained.
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