A Supervised Progressive Growing Generative Adversarial Network for Remote Sensing Image Scene Classification

Abstract

Remote sensing image scene classification is a challenging task. With the development of deep learning, methods based on convolutional neural networks (CNNs) have made great achievements in remote sensing image scene classification. Since the training of a CNN requires a large number of labeled samples, a generative adversarial network (GAN) for sample generation represents a new opportunity to solve the problem of the limited samples. However, most of the existing GAN-based sample generation methods can only generate unlabeled samples, instead of samples labeled with the corresponding scene category. In this article, to solve the problem, a supervised progressive growing generative adversarial network (SPG-GAN) is proposed for remote sensing image scene classification. The proposed method can generate labeled samples for the remote sensing image scene classification, significantly improving the classification accuracy in the case of limited samples. The SPG-GAN method has two main improvements. First, a conditional generative framework for labeled samples is proposed, in which the label information is added in the channel dimension as the input. By considering the constraints of the label information in the loss function, the network can be trained in the direction of a specific category. As a result, the network can generate remote sensing image scene classification samples with label categories. Second, a progressive growing sample generation method is introduced. In order to ensure that the generated samples have more spatial details, they are generated by progressively adding modules to the generator and discriminator, thereby ensuring that the generated sample is of better quality. After testing on two benchmark datasets and carrying out a large-scale experiment in the central area of the city of Wuhan in China, it was found that the proposed method can obtain a superior scene classification accuracy in the case of limited samples.