A subwavelength near-infrared negative index material

Abstract

A single layer of a subwavelength negative index material (NIM) operating at a wavelength of 1 μm is demonstrated. The geometrical parameters of the nanostructure are determined by characterizing its optical transmission spectrum. We show through photonic band calculations that these parameters give rise to a negative index in a corresponding bulk NIM. The fabrication inaccuracies in the dielectric spacer thickness that are likely to be introduced in a prism composed of multiple layers of this structure are shown through full-wave simulations to be within a range that preserves its negative refractive behavior.