Abstract
Abstract In forensic laboratories, analytical investigations of gunshot residues (GSRs) are usually conducted by scanning electron microscopy (SEM) in combination with energy dispersive X-ray (EDX) microanalysis. If GSRs are covered with bloodstains, SEM cannot detect them. In this study, an inductively coupled plasma mass spectrometry (ICP-MS) method is proposed to solve this problem. Results show that bloodstains did not interfere with GSRs and low-level elements are detected. Qualitative and quantitative analyses of Sn, Sb, Ba, and Pb elements in GSRs are also carried out. In addition, testing of GSRs from a type 95–1 rifle and a type 92 pistol is also proposed. Different pretreatment methods are adopted according to the characteristics of different samples. Our investigations suggest that the proposed method has the advantages of low detection limit and high sensitivity and it can be very important in expert testimony.
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