Abstract
In doped ZnO nanorods ( ZnO : In NRs) were grown on Si (111) substrates by using AuGe as a catalyst. In-concentration was controlled as high as 0.33 at.%. The length L to diameter D relationship of NRs revealed that the growth mechanism should be explained in terms of not a simple vapor–liquid–solid (VLS) mechanism but a diffusion-induced growth model. In-induced changes have been investigated from the viewpoint of photoluminescence (PL) property. At room temperature, an increase of extrinsic carrier concentration and interaction with excitons were estimated from the blueshift of peak position and decrease of luminescence intensity. Also, narrow linewidth of low-temperature PL spectra characterized the high structural quality of ZnO : In NRs. We have assigned several PL lines and confirmed the assignment by using excitation power and temperature dependence PL. Considerable evidence of crystal quality degradation was not observed from both measurements; however, we could observe that a defect and donor-bound-exciton complex dominate the PL spectrum. ZnO : In NRs shows good optical quality within our experimental range, and this result strongly supports the feasibility of In -doping to enhance the electrical property of ZnO -based nanostructure.
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