Abstract
In the prediction and improvement of integrated circuit yield, it needs to convert CIF file to BMP file in order to calculate the critical area accurately and optimize the subsequent layout, at the same time, the image format of layout is the foundation of random defects hot spot detection. Firstly, the structures of CIF file and BMP file are studied, and various commands of CIF are deeply analyzed. Secondly, we design the algorithm that is based on the primitives are converted into BMP according to the representation of four basic primitives (rectangle, polygon, circularity, line with width) in CIF layout. Finally, we realize the algorithm of the whole CIF files is converted into BMP files. It is simple, conversion accuracy is high, more importantly, laid the foundation for the improvement of integrated circuit yield, and use C++ language to realize the CIF files conversion software based on the algorithm.
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