Abstract
Auger and photoelectron time coincidence spectroscopy measurements on Si(100) have been carried out employing third generation synchrotron radiation source. This work has been focused on the particular treatment of the collected data required for this kind of experiment. The time structure characteristics of the European Synchrotron Radiation Facility light source have been taken into account in time coincidence data analysis, and compared with other sources. This study has shown the particular influence of the source in the distribution of accidental coincident events, revealing the need to introduce a suitable method for background subtraction in coincidence spectra.
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