A study of the Si(111) [formula omitted]-Ag surface by transmission X-ray diffraction and X-ray diffraction topography

Abstract

The adsorption site of Ag atoms with respect to the unreconstructed Si crystal was uniquely determined using transmission X-ray diffraction. The result is consistent with one of the two honeycomb-chained triangle models previously proposed by the authors using reflection X-ray diffraction. Next, the reconstruction of Si was analyzed; an Si trimer layer is about 0.8 Å below the Ag layer, and at least two double layers of Si are reconstructed, having the component of the honeycomb arrangement. Finally, the capability of surface X-ray diffraction topography was shown by observing the integral-order spot near the Bragg point.