Abstract
The irreversible magnetization, the critical current density and the microstructure of the high-temperature superconductor La1.85Sr0.15CuO4 are compared. Direct observations by transmission electron microscopy (TEM) revealed two orthogonal arrays of extended screw-type dislocations (2 to 5 × 1011 lines per cm2) parallel to the crystallographic directions 〈100〉 and 〈010〉, respectively. These dislocations are dissociated into partial bound stacking faults. Microanalysis showed that Sr concentration around the dislocation cores is about 10% lower than that of the matrix. Measurements of the hysteresis cycle, M(H,T), at various angular orientations (θ.∅) of the field H with respect to the crystalline directions show no detectable correlation between the directions of the dislocations and the critical current density. This suggests that the anisotropy of the critical current density is first of all controlled by the intrinsic properties of the material rather than by the anisotropy of the dislocation structure.
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