Abstract

The far-infrared optical properties of Rexolite™ 1422 were characterized at the University of Lowell Research Foundation using Fourier transform spectroscopy. The spectroscopic transmission measurements were performed on a 0.0236″ thick sample of material over the submillimeter wavelength region from 10 cm−1 to 360 cm−1. Using multiple reflection theory for transmission through an etalon, the frequency dependent complex refractive index of Rexolite™ is reported.

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