A study of the domain structure of carbon black by both high-resolution dark-field electron microscopy and X-ray diffraction

Abstract

High-resolution dark-field electron microscopy was used to observe the domain structure in IRB-2 carbon black. The domains are equiaxed with a dia. of 16±0.5 A ̊ . Most of them have their layerplanes tangent to the surface of the surface of the particle, but occasional domains are observed that are not oriented in this manner. The same carbon black has also been studied by X-ray diffraction techniques. The measured value of the domain size normal to the layer-planes is 16.5 Å; this is in excellent agreement with the electron-microscopic observations. However, the measured values of the layer-plane size varies from 30 Å to 43 Å, depending on the method used to analyze the data.